Tag Archives: test in tray
Wanted: A backend transport standard for burn-in and test
Leaders in the semiconductor industry have learned well the lessons of the learning curve that underlies Moore’s Law, as they assiduously seek ways to accelerate their own learning curves. Fundamentally, the business is simple: Gain a few percentage points in the slope of your learning curve and you win.
Towards a More Efficient Test Paradigm
There is a growing consensus that test and burnin (TBI) requires a new approach. SEMI’s CAST consortium is just the latest attempt to bring focus to an aspect of this looming problem.