Centipede Systems provides technology for testing microelectronic devices
at the extremes of reliability, environment and performance.
Advanced contactor systems allow for test and burn-in under precisely determined conditions in order to detect malfunction, reliability failures and latent defects. Parallel testing of devices in strip, tray or wafer format provides the most cost effective methods for test, burn-in and run-in for a range of applications in high reliability electronics.
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Two sided contactor systems allow testing of advanced multi-chip packages for applications in the lab as well as volume production.
Environmentally and thermally controlled casettes enable testing of strips or trays of devices.
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Sophisticated electrical tests detect latent defects and defective connections before they actually fail in the field.
