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	<title>Centipede Systems</title>
	<link>http://www.centipedesystems.com</link>
	<description>Advanced Contactor Technology</description>
	<lastBuildDate>Sat, 26 Feb 2011 00:22:29 +0000</lastBuildDate>
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		<title>2011 SEMI Award for North America Given to Thomas DiStefano, John W. Smith, Jr. and Michael Warner for Chip Scale Packaging Technology</title>
		<description>HALF MOON BAY, Calif. – January 11, 2011 – SEMI today named Thomas DiStefano, John W. Smith, Jr. and Michael Warner as recipients of the SEMI Award for North America for contributions to the development and commercialization of Micro Ball Grid Array (μBGAÒ ) technology.  This advancement led to many ...</description>
		<link>http://www.centipedesystems.com/2011/02/2011-semi-award-for-north-america-given-to-thomas-distefano-john-w-smith-jr-and-michael-warner-for-chip-scale-packaging-technology/</link>
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		<title>Wanted: A backend transport standard for burn-in and test</title>
		<description>Previously Published June 2009

Leaders in the semiconductor industry have learned well the lessons of the learning curve that underlies Moore’s Law, as they assiduously seek ways to accelerate their own learning curves. Fundamentally, the business is simple: Gain a few percentage points in the slope of your learning curve and ...</description>
		<link>http://www.centipedesystems.com/2010/08/wanted-a-backend-transport-standard-for-burn-in-and-test/</link>
			</item>
	<item>
		<title>Attending Semicon?</title>
		<description>The Test In Tray User Group is a highlight of the test solutions session at 10:30 on July 16 in North Hall. </description>
		<link>http://www.centipedesystems.com/2010/07/attending-semicon/</link>
			</item>
	<item>
		<title>Towards a More Efficient Test Paradigm</title>
		<description>Previously Published April of 2009

There is a growing consensus that test and burnin (TBI) requires a new approach. SEMI’s CAST consortium is just the latest attempt to bring focus to an aspect of this looming problem.

TBI consumes an increasing portion of the manufacturing cost of semiconductor devices. The problem continues ...</description>
		<link>http://www.centipedesystems.com/2010/07/towards-a-more-efficient-test-paradigm/</link>
			</item>
	<item>
		<title>Lights out!</title>
		<description>Previously Published July 2009

Many anticipate that the next upturn in the semiconductor industry is around the corner. But when? And how? At some level we understand that each successive cycle entails new approaches and methods, winners and losers.

Winners develop new technologies during the slump and use them to get ahead ...</description>
		<link>http://www.centipedesystems.com/2010/07/lights-out/</link>
			</item>
	<item>
		<title>Could you have known your product had a fatal flaw?</title>
		<description>Previously Published in August 2009

Our lives in a complex world are increasingly dependent upon ubiquitous electronic devices, many of which are prone to unpredictable failure, leading in some cases to catastrophic losses. A cell phone that dies when inadvertently dropped may be an inconvenience, but a defibrillator failure is a ...</description>
		<link>http://www.centipedesystems.com/2010/07/could-you-have-known-your-product-had-a-fatal-flaw/</link>
			</item>
	<item>
		<title>We&#8217;ve Moved!</title>
		<description>Centipede has a new facility in the heart of Silicon Valley:

41 Daggett Dr.
San Jose, CA 95134 </description>
		<link>http://www.centipedesystems.com/2010/04/centipede/</link>
			</item>
	<item>
		<title>Test-in-Tray User Group</title>
		<description>

A first Test-in-Tray User Group was held in Los Gatos on October 20 to highlight emerging test-in-tray solutions for back-end burn-in and test.

A Keynote by Dr. W. R. Bottoms outlined challenges of ever increasing density and performance needed for future computing systems. Invited talks explored parallel test methods using a ...</description>
		<link>http://www.centipedesystems.com/2010/02/test-in-tray-user-group/</link>
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