A first Test-in-Tray User Group was held in Los Gatos on October 20 to highlight emerging test-in-tray solutions for back-end burn-in and test.

A Keynote by Dr. W. R. Bottoms outlined challenges of ever increasing density and performance needed for future computing systems. Invited talks explored parallel test methods using a tray format that allows full automation of the back end operations.

Participants included 50 leaders from memory, logic, MEMS, EMS and ATE.